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Ng Tuck Wah

rp05854

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Full Name
Ng Tuck Wah
(not current staff)
Variants
NG, TUCK WAH
Ng, Tuck-Wah
Ng, T.W.
 
Main Affiliation
 
Faculty
 
Email
engngtw@nus.edu.sg
 

Publications

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Type:  Article

Results 41-60 of 68 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
4115-Feb-1997Numerical study of effects of pulsatile amplitude on unsteady laminar flows in rigid pipe with ring-type constrictionsLee, T.S. ; Ng, T.W. ; Shi, Z.D.
421-Sep-1994Object illumination angle measurement in speckle interferometryNg, T.W. ; Chau, F.S. 
43Mar-1997Optical Distance Sensing Using Digital Speckle Shearing InterferometryNg, T.W. 
44Nov-2004Optical evaluation of ingot fixity in semiconductor wafer slicingNg, T.W. ; Nallathamby, R.
45Dec-2003Optical sensor for semiconductor chip bondingNg, T.W. ; Ng, C.W.
46Jan-2001Optical surface roughness evaluation of phosphorus-doped polysilicon filmsNg, T.W. ; Teo, T.W.; Rajendra, P.
47Aug-2003Phase-shifting photoelasticity using a flatbed scannerNg, T.W. ; Quek, P.K.; Lim, K.H.
481-Jun-1997Photoelastic illumination by using cathode-ray-tube displaysNg, T.W. ; Sajan, M.R. ; Asundi, A.
49Jun-1997Photoelastic stress analysis using an object step-loading methodNg, T.W. 
502006Photonic surgery with noncoherent lightFeuermann, D.; Gordon, J.M.; Ng, T.W. 
51Jan-2004Resolution analysis of atomic force microscopy using temporal phase modulation interferometryNg, T.W. ; Sasaki, O.; Chua, H.T. 
521-Jan-1996Scattering-angle calibration in an automated small-angle light-scattering apparatusNg, T.W. 
53Aug-2002Shadow moiré topography using a flatbed scannerNg, T.W. ; Tajuddin, A.
5415-Mar-1995Shear measurement in digital speckle shearing interferometry using digital correlationNg, T.W. 
55May-2006Simple tilt and height location monitoring of wafersNg, T.W. ; Tay, A. ; Ong, C.J.
562018Simultaneous Multidrop Creation with Superhydrophobic Wells for Field Environmental Sensing of NanoparticlesChung D.C.K.; Huynh S.H.; Ahmad Zahidi A.A.; Liew O.W. ; Ng T.W. 
57Jul-2007Small Gaussian laser beam diameter measurement using a quadrant photodiodeNg, T.W. ; Tan, H.Y.; Foo, S.L.
581-Mar-1997Speckle photography fringe analysis using the discrete Hartley transformNg, T.W. 
5930-Apr-1997Speckle reduction in the small-angle light scattering technique using sample vibrationNg, T.W. 
6020-Nov-2005Temporal fringe pattern analysis with parallel computingNg, T.W. ; Ang, K.T.; Argentini, G.