Tan Hock Siew

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Full Name

Tan Hock Siew

Variants

Tan, H.S.
Tan, H.-S.
Tan, H.

Main Affiliation

PHYSICS

Faculty

FAC OF SCIENCE

Refined By:

Department: INST OF MATERIALS RESEARCH & ENGINEERING

Type: Article

Results 1-7 of 7 (Search time: 0.003 seconds).

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	Issue Date	Title	Author(s)
1	1-Jun-1997	AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beams	Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.
2	Dec-1996	AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantation	Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.
3	15-Mar-1996	Argon incorporation and silicon carbide formation during low energy argon-ion bombardment of Si(100)	Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.
4	15-Dec-1996	Argon incorporation and surface compositional changes in InP(100) due to low-energy Ar+ ion bombardment	Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.
5	21-Sep-1997	ARXPS analysis of surface compositional change in Ar+ ion bombarded GaAs (100)	Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.
6	Jul-1998	Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAs	Pan, J.S. ; Huan, C.H.A. ; Wee, A.T.S. ; Tan, H.S. ; Tan, K.L.
7	14-Dec-1996	XPS studies on nitridation of InP(100) surface by N+ 2 ion beam bombardment	Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L.