Ong Keng Sian Vincent

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Full Name

Variants

Ong, V.K.S.
Ong, Vincent K.S.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

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Type: Conference Paper

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	Issue Date	Title	Author(s)
1	1997	Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis	Osipowicz, T. ; Sanchez, J.L.; FWatt; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H.
2	Sep-2003	Single contact beam induced current phenomenon for microelectronic failure analysis	Phang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
3	Sep-2003	Single contact beam induced current phenomenon for microelectronic failure analysis	Phang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.