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Anjam Khursheed

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Full Name
Anjam Khursheed
Variants
KHURSHEED ANJAM
Khursheed, Anjam
Khursheed, A.
KHURSHEED, ANJAM
 
Main Affiliation
 
Faculty
 
Email
esphead@nus.edu.sg
 
Other emails
 

Publications

Results 21-40 of 91 (Search time: 0.009 seconds).

Issue DateTitleAuthor(s)
21Jan-1998An on-pole-piece-tip deflector for high-resolution, low-voltage scanning electron microscopesZhao, Y.; Khursheed, A. 
21-Apr-2021Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy (Scientific Reports, (2020), 10, 1, (22144), 10.1038/s41598-020-78973-0)Han, W.; Zheng, M. ; Banerjee, A.; Luo, Y. Z. ; Shen, L. ; Khursheed, A. 
31-Nov-2021Characterization of materials using the secondary electron energy spectromicroscopy techniqueSrinivasan, Avinash ; Han, Weiding ; Zheng, Minrui ; Khursheed, Anjam 
41999Construction and design of a high resolution portable scanning electron microscope columnKhursheed, Anjam 
510-May-2005Converting scanning electron microscopesKHURSHEED, ANJAM ; THONG, THIAM LEONG 
6Jun-1997Curvilinear finite element mesh generation for electron gun simulationKhursheed, A. 
7Aug-2008Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)Khursheed, A. ; Yu, D.
8May-2013Design of a focused electron beam column for ring-cathode sourcesKhursheed, A. 
92009Design of a multiple-electron-beam imaging technique for surface inspectionLuo, T. ; Khursheed, A. ; Osterberg, M. ; Hoang, H. 
10Feb-2011Design of a parallel magnetic box energy analyzer attachment for electron microscopesKhursheed, A. 
11Nov-2010Design of a parallel mass spectrometer for focused ion beam columnsKhursheed, A. ; Cheong, K.H.; Hoang, H.Q. 
1215-Jan-2006Developments in the design of a spectroscopic scanning electron microscopeKhursheed, A. ; Osterberg, M. 
13Nov-2005Dynamic chromatic aberration correction in low energy electron microscopesKhursheed, A. 
1421-Jul-2011EditorialKhursheed, A. 
1521-Jul-2011EditorialKhursheed, A. 
165-Feb-2008Electron microscope and a method of imaging objectsKHURSHEED, ANJAM 
1713-Jul-2006Electron microscope and a method of imaging objectsKHURSHEED, ANJAM 
186-Sep-2011Electrostatic electron spectrometry apparatusKHURSHEED, ANJAM 
19Aug-2008Elemental identification using transmitted and backscattered electrons in an SEMLuo, T. ; Khursheed, A. 
20Sep-1997Experimental investigation into the use of micro-extraction fields for electron beam testingKhursheed, A. ; Goh, S.P.