Wong Kin Mun

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Full Name

Wong Kin Mun

(not current staff)

Variants

Wong, K.-M.
Wong, K.M.

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

elewkm@nus.edu.sg

Refined By:

Author: Hong, Y.D.

Results 1-4 of 4 (Search time: 0.002 seconds).

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	Issue Date	Title	Author(s)
1	Mar-2006	Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement	Hong, Y.D.; Yeow, Y.T.; Chim, W.K. ; Yan, J.; Wong, K.M.
2	2004	Dopant profile extraction by inverse modeling of scanning capacitance microscopy using peak dC/dV	Hong, Y.D.; Yan, J.; Wong, K.M. ; Yeow, Y.T.; Chim, W.K.
3	Sep-2004	Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement	Hong, Y.D.; Yeow, Y.T.; Chim, W.-K. ; Wong, K.-M. ; Kopanski, J.J.
4	Oct-2003	Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy Measurements	Chim, W.K. ; Wong, K.M. ; Yeow, Y.T.; Hong, Y.D.; Lei, Y. ; Teo, L.W.; Choi, W.K.