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He Yandong

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Full Name
He Yandong
Variants
He, Y.
He, Y.D.
 
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Publications

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Author:  Guan, H.
Date Issued:  2000
Subject:  Oxide breakdown

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Issue DateTitleAuthor(s)
1Aug-2000A thorough study of quasi-breakdown phenomenon of thin gate oxide in dual-gate CMOSFET'sGuan, H.; Li, M.-F. ; He, Y. ; Cho, B.J. ; Dong, Z.