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He Yandong

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Full Name
He Yandong
Variants
He, Y.
He, Y.D.
 
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Faculty
 

Publications

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Author:  Guan, H.
Date Issued:  2000
Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 1-3 of 3 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
12000A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stressGuan, H.; Xu, Z.; Cho, B.J. ; Li, M.F. ; He, Y.D. 
2Aug-2000A thorough study of quasi-breakdown phenomenon of thin gate oxide in dual-gate CMOSFET'sGuan, H.; Li, M.-F. ; He, Y. ; Cho, B.J. ; Dong, Z.
32000Investigation of quasi-breakdown mechanism in ultra-thin gate oxidesGuan, H.; He, Y.D. ; Li, M.F. ; Cho, B.J. ; Dong, Z.