1. ScholarBank@NUS

He Yandong

rp02888

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
He Yandong
Variants
He, Y.
He, Y.D.
 
Main Affiliation
 
Faculty
 

Publications

Refined By:
Author:  Li, M.F.
Author:  Dong, Z.

Results 1-6 of 6 (Search time: 0.002 seconds).

Issue DateTitleAuthor(s)
1Aug-2000A thorough study of quasi-breakdown phenomenon of thin gate oxide in dual-gate CMOSFET'sGuan, H.; Li, M.-F. ; He, Y. ; Cho, B.J. ; Dong, Z.
218-Oct-1999Conduction mechanism under quasibreakdown of ultrathin gate oxideHe, Y.D. ; Guan, H.; Li, M.F. ; Cho, B.J. ; Dong, Z.
3May-2001Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxideGuan, H.; Cho, B.J. ; Li, M.F. ; Xu, Z.; He, Y.D. ; Dong, Z.
42000Investigation of quasi-breakdown mechanism in ultra-thin gate oxidesGuan, H.; He, Y.D. ; Li, M.F. ; Cho, B.J. ; Dong, Z.
5May-1999Nondestructive DCIV method to evaluate plasma charging damage in ultrathin gate oxidesGuan, H.; Zhang, Y.; Jie, B.B.; He, Y.D. ; Li, M.-F. ; Dong, Z.; Xie, J.; Wang, J.L.F.; Yen, A.C.; Sheng, G.T.T.; Li, W.
6May-1999Nondestructive DCIV method to evaluate plasma charging damage in ultrathin gate oxidesGuan, H.; Zhang, Y.; Jie, B.B.; He, Y.D. ; Li, M.-F. ; Dong, Z.; Xie, J.; Wang, J.L.F.; Yen, A.C.; Sheng, G.T.T.; Li, W.