Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
 
 
Email
elehowk@nus.edu.sg
 

Publications

Refined By:
Author:  Ho, W.-K.
Department:  COLLEGE OF DESIGN AND ENGINEERING
Department:  ELECTRICAL & COMPUTER ENGINEERING

Results 61-72 of 72 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
612006Robust real-time thin film thickness estimationKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Lee, J.H.
62Feb-2008RTD response time estimation in the presence of temperature variations and its application to semiconductor manufacturingTan, W.W. ; Li, R.F.Y.; Loh, A.P. ; Ho, W.K. 
632002Run-to-run process control for chemical mechanical polishing in semiconductor manufacturingDa, L.; Kumar, V.G.; Tay, A. ; Al Mamun, A. ; Ho, W.K. ; See, A.; Chan, L.
64May-2001Self-tuning IMC-PID control with interval gain and phase margins assignmentHo, W.K. ; Lee, T.H. ; Han, H.P.; Hong, Y.
65Nov-2004Special report: Plant safety and environment: Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
66Nov-2004Special report: Plant safety and environment: Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
67Feb-2007Temperature control and in situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Zhou, Y.; Tan, W.W. ; Chen, M.
682004Temperature control and in-situ fault detection of wafer warpageHo, W.K. ; Yap, C. ; Tay, A. ; Chen, W.; Lim, K.W.
69Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
70Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
71Nov-2005Using the OPC standard for real-time process monitoring and controlLiu, J.; Lim, K.W.; Ho, W.K. ; Tan, K.C. ; Tay, A. ; Srinivasan, R. 
722003Warpage Detection during Baking of Semiconductor substrate in MicrolithographyHo, W.K. ; Tay, A. ; Lim, K.W. ; Zhou, Y.; Yang, K.