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Wang Shihua

rp00373

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Full Name
Wang Shihua
(not current staff)
Variants
Wang, S.
Wang, S.H.
 
Main Affiliation
 
Faculty
 
Email
mpewsh@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]
Type:  Article

Results 1-20 of 31 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
12004A genetic optical interferometric inspection on micro-deformationWang, S.H. ; Quan, C. ; Tay, C.J. 
2Apr-2005An optical shadowgraph microscope for a semiconductor wafer bump height measurementWang, S. ; Quan, C. ; Tay, C.J. 
3Aug-2000Collimating of diverging laser diode beam using graded-index optical fiberWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
4Jan-2003Deformation measurement of a micro-rf capacitive switch membrane using laser interferometryQuan, C. ; Wang, S.H. ; Tay, C.J. ; Liu, A.Q.; Shang, H.M. 
5Jul-2003Deformation measurement of MEMS components using optical interferometryWang, S.H. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
6Oct-2001Design of an optical probe for testing surface roughness and micro-displacementWang, S.H. ; Jin, C.J.; Tay, C.J. ; Quan, C. ; Shang, H.M. 
7Aug-2001Determination of a micromirror angular rotation using laser interferometric methodTay, C.J. ; Quan, C. ; Wang, S.H. ; Shang, H.M. 
8Aug-2001Determination of deflection and Young's modulus of a micro-beam by means of interferometryWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
91-Mar-2003Development of a laser-scattering-based probe for on-line measurement of surface roughnessWang, S. ; Tian, Y.; Tay, C.J. ; Quan, C. 
1015-Mar-2003In situ surface roughness measurement using a laser scattering methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Shang, H.M. 
111-Sep-2000Inspection of micro-cracks on solderball surface using a laser scattering methodQuan, C. ; Wang, S.H. ; Tay, C.J. ; Shang, H.M. ; Chan, K.C.
12Apr-2004Inspection of micro-solderballs on a semiconductor bumped wafer using optical shadowgraphTay, C.J. ; Wang, S.H. ; Quan, C. 
131-Oct-2003Integrated optical inspection on surface geometry and refractive index distribution of a microlens arrayQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
141-Jan-2002Investigation of membrane deformation by a fringe projection methodWang, S. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
15May-2000Laser integrated measurement of surface roughness and micro-displacementWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. ; Zhou, Z.F.
161-Jan-2004Measurement of a fiber-end surface profile by use of phase-shifting laser interferometryWang, S. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.
1715-Apr-2004Measurement of a micro-solderball height using a laser projection methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Lee, B.W.; Chan, K.C.
18Mar-2001Measurement of a microphone membrane deflection profile using an optical fibre and wedge fringe projectionTay, C.J. ; Quan, C. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
19Jan-2006Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometryQuan, C. ; Wang, S.H. ; Tay, C.J. 
20Jun-2003New method for measuring dynamic response of small components by fringe projectionTay, C.J. ; Quan, C. ; Shang, H.M. ; Wu, T.; Wang, S.