See Kai Hung,Alex

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Full Name

See Kai Hung,Alex

(not current staff)

Variants

See, A.
See, A.K.
See, K.H.
SEE, ALEX

Main Affiliation

PHYSICS

Faculty

FAC OF SCIENCE

physeea@nus.edu.sg

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Author: See, A.K.

Type: Conference Paper

Results 1-9 of 9 (Search time: 0.003 seconds).

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	Issue Date	Title	Author(s)
1	2000	Application of excimer laser annealing in the formation of ultra-shallow p+/n junctions	Chong, Y.F.; Pey, K.L. ; Wee, A.T.S. ; See, A. ; Tung, C.-H. ; Gopalakrishnan, R. ; Lu, Y.F.
2	2001	Direct formation of C54 phase on the basis of C40 TiSi2 and its applications in deep sub-micron technology	Chen, S.Y.; Shen, Z.X. ; Xu, S.Y. ; See, A.K. ; Chan, L.H.; Li, W.S.
3	2001	Effect of transmission line pulsing of interconnects investigated using combined low-frequency noise and resistance measurements	Chu, L.W.; Chim, W.K. ; Pey, K.L. ; See, A.
4	1999	Impact of voids in Ti-salicided p+ polysilicon lines on TiSi2 electrical properties	Chua, H.N.; Pey, K.L. ; Siah, S.Y.; Ong, L.Y.; Lim, E.H.; Gan, C.L.; See, K.H. ; Ho, C.S.
5	2001	In-line plasma induced charging monitor for 0.15μm polysilicon gate etching	Chong, D.; Won Jong Yoo; Ting Cheong Ang; Sang Yee Loong; Cha, R.; Pin Hian Lee; Layadi, N.; Chan, L.; See, A.
6	2001	Mask error enhancement factor for sub 0.13μm lithography	Tan, S.K.; Lin, Q.; Quan, C. ; Tay, C.J. ; See, A.
7	2000	Steep retrograde indium channel profiling for high performance nMOSFETs device fabrication	Ong, S.Y.; Chor, E.F. ; Leung, Y.K.; Lee, J.; Li, W.S. ; See, A. ; Chan, L.
8	2002	Synthesis of pure C40 TiSi2 for Si wafer fabrication	Chen, S.Y.; Shen, Z.X. ; Xu, S.Y. ; See, A.K. ; Chan, L.H.; Li, W.S.
9	2000	Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f	Ng, C.M.; Wee, A.T.S. ; Huan, C.H.A. ; See, A.