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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

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Department:  MATERIALS SCIENCE
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Type:  Article

Results 1-17 of 17 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1Jul-2001Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuumsLiu, L. ; Wang, Y. ; Gong, H. 
220-Oct-2001Annealing effects of tantalum thin films sputtered on [001] silicon substrateLiu, L. ; Gong, H. ; Wang, Y. ; Wang, J. ; Wee, A.T.S ; Liu, R. 
3May-2000Effect of magnetic anisotropy distribution in longitudinal thin film mediaHee, C.H.; Wang, J.P.; Gong, H. ; Low, T.S. 
42000Effects of surface smoothness and deposition temperature of floating gates in flash memory devices to oxide/nitride/oxide interpoly dielectric breakdownCha, C.L.; Chor, E.F. ; Gong, H. ; Chan, L.
51-Aug-2001Electrical characterization and metallurgical analysis of Pd-containing multilayer contacts on GaNChor, E.F. ; Zhang, D.; Gong, H. ; Chen, G.L.; Liew, T.Y.F.
6Mar-2000Electrical characterization, metallurgical investigation, and thermal stability studies of (Pd, Ti, Au)-based ohmic contactsChor, E.F. ; Zhang, D.; Gong, H. ; Chong, W.K.; Ong, S.Y.
71999Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoidCha, C.-L.; Tee, K.-C.; Chor, E.-F. ; Gong, H. ; Prasad, K.; Bourdillon, A.J. ; See, A. ; Chan, L.; Lee, M.M.-O.
81999Evaluation of rapid thermal nitrided ONO interpoly dielectric resistance to plasma process-induced damageCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Dong, Z.; Chan, L.
91-Sep-1999Evaluation of silicon nitride and silicon carbide as efficient polysilicon grain-growth inhibitorsCha, C.L.; Chor, E.F. ; Jia, Y.M.; Bourdillon, A.J. ; Gong, H. ; Pan, J.S.; Zhang, A.Q.; Tang, S.K.; Boothroyd, C.B.
1015-Sep-2002Kinetics and mechanisms of laser-induced decompositions of hydrogenated amorphous carbon films on magnetic hard disksZhang, L.H.; Gong, H. ; Wang, J.P. 
1115-Jun-2002Kinetics and mechanisms of the thermal degradation of amorphous carbon filmsZhang, L.H.; Gong, H. ; Wang, J.P. 
1215-Jul-1998Morphology and magnetic analysis of MnSb films grown by hot-wall epitaxyLow, B.L.; Ong, C.K. ; Han, G.C. ; Gong, H. ; Liew, T.Y.F. ; Tatsuoka, H.; Kuwabara, H.; Yang, Z.
1322-Aug-2001Optical and electrical properties of p-type transparent conducting Cu-Al-O thin films prepared by plasma enhanced chemical vapor depositionWang, Y. ; Gong, H. ; Zhu, F.; Liu, L. ; Huang, L. ; Huan, A.C.H.
142000Plasma etching optimization of oxide/nitride/oxide interpoly dielectric breakdown time in flash memory devicesCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.
1515-May-1999Structure and magnetization of MnSb thin films deposited at different substrate temperaturesLow, B.L.; Ong, C.K. ; Lin, J. ; Huan, A.C.H. ; Gong, H. ; Liew, T.Y.F. 
1619-Jul-1999Surface smoothing of floating gates in flash memory devices via surface nitrogen and carbon incorporationCha, C.-L.; Chor, E.-F. ; Gong, H. ; Bourdillon, A.J. ; Jia, Y.-M.; Pan, J.-S. ; Zhang, A.-Q.; Chan, L.
174-Mar-2002Thermal decomposition kinetics of amorphous carbon nitride and carbon filmsZhang, L.H.; Gong, H. ; Wang, J.P.