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|Title:||Nuclear microscopy of single aerosol particle||Authors:||Orlic, I.
|Issue Date:||2-Mar-1994||Citation:||Orlic, I.,Watt, F.,Loh, K.K.,Tang, S.M. (1994-03-02). Nuclear microscopy of single aerosol particle. Nuclear Inst. and Methods in Physics Research, B 85 (1-4) : 840-844. ScholarBank@NUS Repository.||Abstract:||The Nuclear Microscope at the National University of Singapore is being used for the analysis of single aerosol particles. The methodology of utilizing off-axis Scanning Transmission Ion Microscopy (STIM) to identify and characterize the size and shape of the particles, Rutherford backscattering (RBS) to determine the matrix composition and effective thickness, and Particle Induced X-ray Emission (PIXE) to determine the minor and trace elements to the ppm level, is presented. Thin film pioloform substrates are found to be the most suitable backing material for the single particle analysis. © 1994.||Source Title:||Nuclear Inst. and Methods in Physics Research, B||URI:||http://scholarbank.nus.edu.sg/handle/10635/97383||ISSN:||0168583X|
|Appears in Collections:||Staff Publications|
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