Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/97383
DC FieldValue
dc.titleNuclear microscopy of single aerosol particle
dc.contributor.authorOrlic, I.
dc.contributor.authorWatt, F.
dc.contributor.authorLoh, K.K.
dc.contributor.authorTang, S.M.
dc.date.accessioned2014-10-16T09:34:36Z
dc.date.available2014-10-16T09:34:36Z
dc.date.issued1994-03-02
dc.identifier.citationOrlic, I.,Watt, F.,Loh, K.K.,Tang, S.M. (1994-03-02). Nuclear microscopy of single aerosol particle. Nuclear Inst. and Methods in Physics Research, B 85 (1-4) : 840-844. ScholarBank@NUS Repository.
dc.identifier.issn0168583X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97383
dc.description.abstractThe Nuclear Microscope at the National University of Singapore is being used for the analysis of single aerosol particles. The methodology of utilizing off-axis Scanning Transmission Ion Microscopy (STIM) to identify and characterize the size and shape of the particles, Rutherford backscattering (RBS) to determine the matrix composition and effective thickness, and Particle Induced X-ray Emission (PIXE) to determine the minor and trace elements to the ppm level, is presented. Thin film pioloform substrates are found to be the most suitable backing material for the single particle analysis. © 1994.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.sourcetitleNuclear Inst. and Methods in Physics Research, B
dc.description.volume85
dc.description.issue1-4
dc.description.page840-844
dc.description.codenNIMBE
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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