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|Title:||Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation||Authors:||Mangaiyarkarasi, D.
|Issue Date:||2006||Citation:||Mangaiyarkarasi, D., Breese, M.B.H., Ow, Y.S., Vijila, C. (2006). Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation. Applied Physics Letters 89 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2219989||Abstract:||High-energy focused proton beam irradiation has been used to controllably blueshift the resonant wavelength of porous silicon microcavities in heavily doped p-type wafers. Irradiation results in an increased resistivity, hence a locally reduced rate of anodization. Irradiated regions are consequently thinner and of a higher refractive index than unirradiated regions, and the microcavity blueshift arises from a net reduction in the optical thickness of each porous layer. Using this process wafers are patterned on a micrometer lateral scale with microcavities tuned to different resonant wavelengths, giving rise to high-resolution full-color reflection images over the full visible spectrum. © 2006 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/96084||ISSN:||00036951||DOI:||10.1063/1.2219989|
|Appears in Collections:||Staff Publications|
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