Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2219989
Title: Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation
Authors: Mangaiyarkarasi, D. 
Breese, M.B.H. 
Ow, Y.S. 
Vijila, C.
Issue Date: 2006
Citation: Mangaiyarkarasi, D., Breese, M.B.H., Ow, Y.S., Vijila, C. (2006). Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation. Applied Physics Letters 89 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2219989
Abstract: High-energy focused proton beam irradiation has been used to controllably blueshift the resonant wavelength of porous silicon microcavities in heavily doped p-type wafers. Irradiation results in an increased resistivity, hence a locally reduced rate of anodization. Irradiated regions are consequently thinner and of a higher refractive index than unirradiated regions, and the microcavity blueshift arises from a net reduction in the optical thickness of each porous layer. Using this process wafers are patterned on a micrometer lateral scale with microcavities tuned to different resonant wavelengths, giving rise to high-resolution full-color reflection images over the full visible spectrum. © 2006 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/96084
ISSN: 00036951
DOI: 10.1063/1.2219989
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