Please use this identifier to cite or link to this item:
|Title:||Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation|
|Authors:||Mangaiyarkarasi, D. |
|Citation:||Mangaiyarkarasi, D., Breese, M.B.H., Ow, Y.S., Vijila, C. (2006). Controlled blueshift of the resonant wavelength in porous silicon microcavities using ion irradiation. Applied Physics Letters 89 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2219989|
|Abstract:||High-energy focused proton beam irradiation has been used to controllably blueshift the resonant wavelength of porous silicon microcavities in heavily doped p-type wafers. Irradiation results in an increased resistivity, hence a locally reduced rate of anodization. Irradiated regions are consequently thinner and of a higher refractive index than unirradiated regions, and the microcavity blueshift arises from a net reduction in the optical thickness of each porous layer. Using this process wafers are patterned on a micrometer lateral scale with microcavities tuned to different resonant wavelengths, giving rise to high-resolution full-color reflection images over the full visible spectrum. © 2006 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 21, 2019
WEB OF SCIENCETM
checked on Mar 12, 2019
checked on Mar 8, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.