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|Title:||Origin of the enhanced polarization in la and Mg co-substituted BiFeO 3 thin film during the fatigue process||Authors:||Ke, Q.
|Issue Date:||23-Jan-2012||Citation:||Ke, Q., Kumar, A., Lou, X., Zeng, K., Wang, J. (2012-01-23). Origin of the enhanced polarization in la and Mg co-substituted BiFeO 3 thin film during the fatigue process. Applied Physics Letters 100 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3678636||Abstract:||We have studied the polarization fatigue of La and Mg co-substituted BiFeO 3 thin film, where a polarization peak is observed during the fatigue process. The origin of such anomalous behavior is analyzed on the basis of the defect evolution using temperature-dependent impedance spectroscopy. It shows that the motion of oxygen vacancies (V O ••) is associated with a lower energy barrier, accompanied by the injection of electrons into the film during the fatigue process. A qualitative model is proposed to explain the fatigue behavior, which involves the modification of the Schottky barrier upon the accumulation of V O •• at the metal-dielectric interface. © 2012 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/85527||ISSN:||00036951||DOI:||10.1063/1.3678636|
|Appears in Collections:||Staff Publications|
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