Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3678636
Title: Origin of the enhanced polarization in la and Mg co-substituted BiFeO 3 thin film during the fatigue process
Authors: Ke, Q.
Kumar, A.
Lou, X.
Zeng, K. 
Wang, J. 
Issue Date: 23-Jan-2012
Citation: Ke, Q., Kumar, A., Lou, X., Zeng, K., Wang, J. (2012-01-23). Origin of the enhanced polarization in la and Mg co-substituted BiFeO 3 thin film during the fatigue process. Applied Physics Letters 100 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3678636
Abstract: We have studied the polarization fatigue of La and Mg co-substituted BiFeO 3 thin film, where a polarization peak is observed during the fatigue process. The origin of such anomalous behavior is analyzed on the basis of the defect evolution using temperature-dependent impedance spectroscopy. It shows that the motion of oxygen vacancies (V O ••) is associated with a lower energy barrier, accompanied by the injection of electrons into the film during the fatigue process. A qualitative model is proposed to explain the fatigue behavior, which involves the modification of the Schottky barrier upon the accumulation of V O •• at the metal-dielectric interface. © 2012 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/85527
ISSN: 00036951
DOI: 10.1063/1.3678636
Appears in Collections:Staff Publications

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