Please use this identifier to cite or link to this item:
|Title:||Origin of the enhanced polarization in la and Mg co-substituted BiFeO 3 thin film during the fatigue process|
|Source:||Ke, Q., Kumar, A., Lou, X., Zeng, K., Wang, J. (2012-01-23). Origin of the enhanced polarization in la and Mg co-substituted BiFeO 3 thin film during the fatigue process. Applied Physics Letters 100 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3678636|
|Abstract:||We have studied the polarization fatigue of La and Mg co-substituted BiFeO 3 thin film, where a polarization peak is observed during the fatigue process. The origin of such anomalous behavior is analyzed on the basis of the defect evolution using temperature-dependent impedance spectroscopy. It shows that the motion of oxygen vacancies (V O ••) is associated with a lower energy barrier, accompanied by the injection of electrons into the film during the fatigue process. A qualitative model is proposed to explain the fatigue behavior, which involves the modification of the Schottky barrier upon the accumulation of V O •• at the metal-dielectric interface. © 2012 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.