Laser micro-bumping and contamination-free tagging on magnetic hard disk surfaces, techniques and applications

Abstract

Laser micro-bumping and contamination-free tagging magnetic hard disk surfaces had been intensively investigated. Diode-pumped Nd:YVO4 laser with fundamental output was used for micro-bumping on NiP surface and contamination-free tagging on finished disk surface. Atomic force microscopy and Auger electron spectroscopy were employed to analyse processed samples. Processing results versus laser parameters were studied and optimized in detail. Based on the research, the techniques were commercialized subsequently. In this paper, we present our experimental results and introduce their applications.