Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.456830
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dc.titleLaser micro-bumping and contamination-free tagging on magnetic hard disk surfaces, techniques and applications
dc.contributor.authorLiu, D.
dc.contributor.authorWee, T.S.
dc.contributor.authorYuan, Y.
dc.contributor.authorLu, Y.F.
dc.contributor.authorHong, M.
dc.contributor.authorGoh, R.
dc.date.accessioned2014-10-07T04:46:21Z
dc.date.available2014-10-07T04:46:21Z
dc.date.issued2002
dc.identifier.citationLiu, D., Wee, T.S., Yuan, Y., Lu, Y.F., Hong, M., Goh, R. (2002). Laser micro-bumping and contamination-free tagging on magnetic hard disk surfaces, techniques and applications. Proceedings of SPIE - The International Society for Optical Engineering 4426 : 359-362. ScholarBank@NUS Repository. https://doi.org/10.1117/12.456830
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83889
dc.description.abstractLaser micro-bumping and contamination-free tagging magnetic hard disk surfaces had been intensively investigated. Diode-pumped Nd:YVO4 laser with fundamental output was used for micro-bumping on NiP surface and contamination-free tagging on finished disk surface. Atomic force microscopy and Auger electron spectroscopy were employed to analyse processed samples. Processing results versus laser parameters were studied and optimized in detail. Based on the research, the techniques were commercialized subsequently. In this paper, we present our experimental results and introduce their applications.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.456830
dc.sourceScopus
dc.subjectLaser contamination-free tagging
dc.subjectLaser micro-bumping
dc.subjectMagnetic hard disk
dc.typeConference Paper
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1117/12.456830
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume4426
dc.description.page359-362
dc.description.codenPSISD
dc.identifier.isiut000176422100077
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