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|Title:||Observation of strong magnetic anisotropy in zinc-blende CrTe thin films||Authors:||Bi, J.F.
|Issue Date:||2008||Citation:||Bi, J.F., Sreenivasan, M.G., Teo, K.L., Liew, T. (2008). Observation of strong magnetic anisotropy in zinc-blende CrTe thin films. Journal of Physics D: Applied Physics 41 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/41/4/045002||Abstract:||We report the growth of zinc-blende CrTe thin films with a nominal thickness of 5 nm by low-temperature molecular-beam epitaxy. Reflection high-energy electron diffraction patterns, atomic force microscopy and high-resolution transmission electron microscopy analyses established that a quasi-two-dimensional layer-by-layer growth mode is achieved. We observe a strong magnetic anisotropy in the film with an easy axis along the [0 0 1] direction. The uniaxial (KU) and cubic (KC) anisotropy constants are obtained through the fitting of the hard axes along the [0 1 1] and directions of the magnetization curves. A Curie temperature of 100 K is obtained from the temperature-dependent remanent-magnetization measurement. © 2008 IOP Publishing Ltd.||Source Title:||Journal of Physics D: Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/82798||ISSN:||00223727||DOI:||10.1088/0022-3727/41/4/045002|
|Appears in Collections:||Staff Publications|
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