Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/41/4/045002
Title: Observation of strong magnetic anisotropy in zinc-blende CrTe thin films
Authors: Bi, J.F.
Sreenivasan, M.G.
Teo, K.L. 
Liew, T.
Issue Date: 2008
Citation: Bi, J.F., Sreenivasan, M.G., Teo, K.L., Liew, T. (2008). Observation of strong magnetic anisotropy in zinc-blende CrTe thin films. Journal of Physics D: Applied Physics 41 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/41/4/045002
Abstract: We report the growth of zinc-blende CrTe thin films with a nominal thickness of 5 nm by low-temperature molecular-beam epitaxy. Reflection high-energy electron diffraction patterns, atomic force microscopy and high-resolution transmission electron microscopy analyses established that a quasi-two-dimensional layer-by-layer growth mode is achieved. We observe a strong magnetic anisotropy in the film with an easy axis along the [0 0 1] direction. The uniaxial (KU) and cubic (KC) anisotropy constants are obtained through the fitting of the hard axes along the [0 1 1] and directions of the magnetization curves. A Curie temperature of 100 K is obtained from the temperature-dependent remanent-magnetization measurement. © 2008 IOP Publishing Ltd.
Source Title: Journal of Physics D: Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/82798
ISSN: 00223727
DOI: 10.1088/0022-3727/41/4/045002
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