Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/41/4/045002
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dc.titleObservation of strong magnetic anisotropy in zinc-blende CrTe thin films
dc.contributor.authorBi, J.F.
dc.contributor.authorSreenivasan, M.G.
dc.contributor.authorTeo, K.L.
dc.contributor.authorLiew, T.
dc.date.accessioned2014-10-07T04:33:38Z
dc.date.available2014-10-07T04:33:38Z
dc.date.issued2008
dc.identifier.citationBi, J.F., Sreenivasan, M.G., Teo, K.L., Liew, T. (2008). Observation of strong magnetic anisotropy in zinc-blende CrTe thin films. Journal of Physics D: Applied Physics 41 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/41/4/045002
dc.identifier.issn00223727
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82798
dc.description.abstractWe report the growth of zinc-blende CrTe thin films with a nominal thickness of 5 nm by low-temperature molecular-beam epitaxy. Reflection high-energy electron diffraction patterns, atomic force microscopy and high-resolution transmission electron microscopy analyses established that a quasi-two-dimensional layer-by-layer growth mode is achieved. We observe a strong magnetic anisotropy in the film with an easy axis along the [0 0 1] direction. The uniaxial (KU) and cubic (KC) anisotropy constants are obtained through the fitting of the hard axes along the [0 1 1] and directions of the magnetization curves. A Curie temperature of 100 K is obtained from the temperature-dependent remanent-magnetization measurement. © 2008 IOP Publishing Ltd.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1088/0022-3727/41/4/045002
dc.description.sourcetitleJournal of Physics D: Applied Physics
dc.description.volume41
dc.description.issue4
dc.description.page-
dc.description.codenJPAPB
dc.identifier.isiut000253177900007
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