Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3684617

Title:	Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts
Authors:	Wu, Y. Wang, Y. Wang, J. Zhou, M. Zhang, A. Zhang, C. Yang, Y. Hua, Y. Xu, B.
Issue Date:	2012
Citation:	Wu, Y., Wang, Y., Wang, J., Zhou, M., Zhang, A., Zhang, C., Yang, Y., Hua, Y., Xu, B. (2012). Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts. AIP Advances 2 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3684617
Abstract:	Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.© Copyright 2012 Author(s).
Source Title:	AIP Advances
URI:	http://scholarbank.nus.edu.sg/handle/10635/82252
ISSN:	21583226
DOI:	10.1063/1.3684617
Appears in Collections:	Staff Publications

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