Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.3684617
DC Field | Value | |
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dc.title | Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts | |
dc.contributor.author | Wu, Y. | |
dc.contributor.author | Wang, Y. | |
dc.contributor.author | Wang, J. | |
dc.contributor.author | Zhou, M. | |
dc.contributor.author | Zhang, A. | |
dc.contributor.author | Zhang, C. | |
dc.contributor.author | Yang, Y. | |
dc.contributor.author | Hua, Y. | |
dc.contributor.author | Xu, B. | |
dc.date.accessioned | 2014-10-07T04:27:10Z | |
dc.date.available | 2014-10-07T04:27:10Z | |
dc.date.issued | 2012 | |
dc.identifier.citation | Wu, Y., Wang, Y., Wang, J., Zhou, M., Zhang, A., Zhang, C., Yang, Y., Hua, Y., Xu, B. (2012). Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts. AIP Advances 2 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3684617 | |
dc.identifier.issn | 21583226 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82252 | |
dc.description.abstract | Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.© Copyright 2012 Author(s). | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3684617 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | DATA STORAGE INSTITUTE | |
dc.contributor.department | PHYSICS | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1063/1.3684617 | |
dc.description.sourcetitle | AIP Advances | |
dc.description.volume | 2 | |
dc.description.issue | 1 | |
dc.description.page | - | |
dc.identifier.isiut | 000302225400050 | |
Appears in Collections: | Staff Publications |
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