Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3684617
Title: Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts
Authors: Wu, Y. 
Wang, Y. 
Wang, J.
Zhou, M.
Zhang, A. 
Zhang, C. 
Yang, Y.
Hua, Y.
Xu, B. 
Issue Date: 2012
Citation: Wu, Y., Wang, Y., Wang, J., Zhou, M., Zhang, A., Zhang, C., Yang, Y., Hua, Y., Xu, B. (2012). Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts. AIP Advances 2 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3684617
Abstract: Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.© Copyright 2012 Author(s).
Source Title: AIP Advances
URI: http://scholarbank.nus.edu.sg/handle/10635/82252
ISSN: 21583226
DOI: 10.1063/1.3684617
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