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|Title:||Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts|
|Authors:||Wu, Y. |
|Citation:||Wu, Y., Wang, Y., Wang, J., Zhou, M., Zhang, A., Zhang, C., Yang, Y., Hua, Y., Xu, B. (2012). Electrical transport across metal/two-dimensional carbon junctions: Edge versus side contacts. AIP Advances 2 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3684617|
|Abstract:||Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV αV), whereas the latter is characterized by a nonlinear dependence, dI/dV αV3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.© Copyright 2012 Author(s).|
|Source Title:||AIP Advances|
|Appears in Collections:||Staff Publications|
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