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https://doi.org/10.1149/1.2913093
| Title: | Structure and optical properties of ZnO/NiSi/Si system | Authors: | Wei, R. Gong, H. Dongzhi, C. |
Issue Date: | 2008 | Citation: | Wei, R.,Gong, H.,Dongzhi, C. (2008). Structure and optical properties of ZnO/NiSi/Si system. ECS Transactions 13 (3) : 177-182. ScholarBank@NUS Repository. https://doi.org/10.1149/1.2913093 | Abstract: | High quality ZnO films grown on NiSi/Si as well as chemically cleaned Si substrates were investigated. It was found that better light emission properties were obtained in ZnO/NiSi/Si system than in ZnO/Si counterpart. A filter effect of NiSi was notably found, which could greatly improve the signal-to-noise ratio of the ZnO film during Raman measurement. ©The Electrochemical Society. | Source Title: | ECS Transactions | URI: | http://scholarbank.nus.edu.sg/handle/10635/75250 | ISBN: | 9781566776288 | ISSN: | 19385862 | DOI: | 10.1149/1.2913093 |
| Appears in Collections: | Staff Publications |
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