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Please use this identifier to cite or link to this item: https://doi.org/10.1149/1.2913093
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dc.titleStructure and optical properties of ZnO/NiSi/Si system
dc.contributor.authorWei, R.
dc.contributor.authorGong, H.
dc.contributor.authorDongzhi, C.
dc.date.accessioned2014-06-19T09:34:13Z
dc.date.available2014-06-19T09:34:13Z
dc.date.issued2008
dc.identifier.citationWei, R.,Gong, H.,Dongzhi, C. (2008). Structure and optical properties of ZnO/NiSi/Si system. ECS Transactions 13 (3) : 177-182. ScholarBank@NUS Repository. <a href="https://doi.org/10.1149/1.2913093" target="_blank">https://doi.org/10.1149/1.2913093</a>
dc.identifier.isbn9781566776288
dc.identifier.issn19385862
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/75250
dc.description.abstractHigh quality ZnO films grown on NiSi/Si as well as chemically cleaned Si substrates were investigated. It was found that better light emission properties were obtained in ZnO/NiSi/Si system than in ZnO/Si counterpart. A filter effect of NiSi was notably found, which could greatly improve the signal-to-noise ratio of the ZnO film during Raman measurement. ©The Electrochemical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1149/1.2913093
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1149/1.2913093
dc.description.sourcetitleECS Transactions
dc.description.volume13
dc.description.issue3
dc.description.page177-182
dc.identifier.isiutNOT_IN_WOS
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