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|Title:||Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films||Authors:||Leong, S.H.
Magnetic hardness coefficient
Magneto-optical Kerr effect
Saturation magnetization curve
|Issue Date:||Sep-2000||Citation:||Leong, S.H.,Wang, J.P.,Low, T.S. (2000-09). Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films. IEEE Transactions on Magnetics 36 (5 I) : 3611-3613. ScholarBank@NUS Repository. https://doi.org/10.1109/20.908917||Abstract:||A Magneto-optical Kerr Effect (MOKE) system was built and used for acquiring saturation magnetization curves and measuring the magnetic hardness coefficient, a of magnetic thin film samples. Co thin films were sputtered on glass substrate under various sputtering conditions. The magnetic hardness coefficient was measured using the MOKE setup. Results for a (Oe) were further correlated using transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis. It was found that a (Oe), a useful indicator for in-depth defects in Co films, increased with both working and base pressure but decreased with higher deposition temperatures. This trend is in agreement with well-known microstructure control techniques by changing sputtering parameters.||Source Title:||IEEE Transactions on Magnetics||URI:||http://scholarbank.nus.edu.sg/handle/10635/72946||ISSN:||00189464||DOI:||10.1109/20.908917|
|Appears in Collections:||Staff Publications|
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