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https://doi.org/10.1109/20.908917
| Title: | Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films | Authors: | Leong, S.H. Wang, J.P. Low, T.S. |
Keywords: | In-depth defects Magnetic hardness coefficient Magneto-optical Kerr effect Saturation magnetization curve |
Issue Date: | Sep-2000 | Citation: | Leong, S.H.,Wang, J.P.,Low, T.S. (2000-09). Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films. IEEE Transactions on Magnetics 36 (5 I) : 3611-3613. ScholarBank@NUS Repository. https://doi.org/10.1109/20.908917 | Abstract: | A Magneto-optical Kerr Effect (MOKE) system was built and used for acquiring saturation magnetization curves and measuring the magnetic hardness coefficient, a of magnetic thin film samples. Co thin films were sputtered on glass substrate under various sputtering conditions. The magnetic hardness coefficient was measured using the MOKE setup. Results for a (Oe) were further correlated using transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis. It was found that a (Oe), a useful indicator for in-depth defects in Co films, increased with both working and base pressure but decreased with higher deposition temperatures. This trend is in agreement with well-known microstructure control techniques by changing sputtering parameters. | Source Title: | IEEE Transactions on Magnetics | URI: | http://scholarbank.nus.edu.sg/handle/10635/72946 | ISSN: | 00189464 | DOI: | 10.1109/20.908917 |
| Appears in Collections: | Staff Publications |
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