Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.908917
Title: Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films
Authors: Leong, S.H.
Wang, J.P.
Low, T.S. 
Keywords: In-depth defects
Magnetic hardness coefficient
Magneto-optical Kerr effect
Saturation magnetization curve
Issue Date: Sep-2000
Source: Leong, S.H.,Wang, J.P.,Low, T.S. (2000-09). Study of in-depth defects using Magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films. IEEE Transactions on Magnetics 36 (5 I) : 3611-3613. ScholarBank@NUS Repository. https://doi.org/10.1109/20.908917
Abstract: A Magneto-optical Kerr Effect (MOKE) system was built and used for acquiring saturation magnetization curves and measuring the magnetic hardness coefficient, a of magnetic thin film samples. Co thin films were sputtered on glass substrate under various sputtering conditions. The magnetic hardness coefficient was measured using the MOKE setup. Results for a (Oe) were further correlated using transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis. It was found that a (Oe), a useful indicator for in-depth defects in Co films, increased with both working and base pressure but decreased with higher deposition temperatures. This trend is in agreement with well-known microstructure control techniques by changing sputtering parameters.
Source Title: IEEE Transactions on Magnetics
URI: http://scholarbank.nus.edu.sg/handle/10635/72946
ISSN: 00189464
DOI: 10.1109/20.908917
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