Please use this identifier to cite or link to this item:
|Title:||Pulsed-laser deposition of TiNi shape memory alloy thin films||Authors:||Chen, X.Y.
|Issue Date:||2001||Citation:||Chen, X.Y.,Lu, Y.F.,Ren, Z.M.,Zhang, L.,Wang, J.P.,Liew, T.Y.F. (2001). Pulsed-laser deposition of TiNi shape memory alloy thin films. Materials Research Society Symposium - Proceedings 672 : O10.12.1-O10.12.6. ScholarBank@NUS Repository.||Abstract:||Thin films of TiNi shape memory alloy (SMA) have been prepared by pulsed-laser deposition (PLD) at different substrate temperatures. The stoichiometry, crystallinity, and morphology of the deposited films were characterized by X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and atom force microscopy (AFM). The transformation behavior and crystallization temperatures were investigated by differential scanning calorimetry (DSC). It is found that the Ni content of the deposited films ranges from 46.7 to 52.0 at.%. The crystallization temperature of the amorphous films is around 460°C. The activation energy of the crystallization process is determined by Kissinger's method to be 301 kJ/mol. The martensitic transformation temperature of the annealed Ti-51.5 at.% Ni film is -20.8°C.||Source Title:||Materials Research Society Symposium - Proceedings||URI:||http://scholarbank.nus.edu.sg/handle/10635/71528||ISSN:||02729172|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on May 17, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.