Buckling of a stiff thin film on a compliant substrate in large deformation

Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.ijsolstr.2008.01.023

Title:	Buckling of a stiff thin film on a compliant substrate in large deformation
Authors:	Song, J. Jiang, H. Liu, Z.J. Khang, D.Y. Huang, Y. Rogers, J.A. Lu, C. Koh, C.G.
Keywords:	Buckling Finite deformation Finite element analysis Perturbation analysis Thin film
Issue Date:	15-May-2008
Citation:	Song, J., Jiang, H., Liu, Z.J., Khang, D.Y., Huang, Y., Rogers, J.A., Lu, C., Koh, C.G. (2008-05-15). Buckling of a stiff thin film on a compliant substrate in large deformation. International Journal of Solids and Structures 45 (10) : 3107-3121. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ijsolstr.2008.01.023
Abstract:	A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically. © 2008 Elsevier Ltd. All rights reserved.
Source Title:	International Journal of Solids and Structures
URI:	http://scholarbank.nus.edu.sg/handle/10635/65256
ISSN:	00207683
DOI:	10.1016/j.ijsolstr.2008.01.023
Appears in Collections:	Staff Publications

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