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Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.ijsolstr.2008.01.023
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dc.titleBuckling of a stiff thin film on a compliant substrate in large deformation
dc.contributor.authorSong, J.
dc.contributor.authorJiang, H.
dc.contributor.authorLiu, Z.J.
dc.contributor.authorKhang, D.Y.
dc.contributor.authorHuang, Y.
dc.contributor.authorRogers, J.A.
dc.contributor.authorLu, C.
dc.contributor.authorKoh, C.G.
dc.date.accessioned2014-06-17T08:14:45Z
dc.date.available2014-06-17T08:14:45Z
dc.date.issued2008-05-15
dc.identifier.citationSong, J., Jiang, H., Liu, Z.J., Khang, D.Y., Huang, Y., Rogers, J.A., Lu, C., Koh, C.G. (2008-05-15). Buckling of a stiff thin film on a compliant substrate in large deformation. International Journal of Solids and Structures 45 (10) : 3107-3121. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ijsolstr.2008.01.023
dc.identifier.issn00207683
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/65256
dc.description.abstractA finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically. © 2008 Elsevier Ltd. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.ijsolstr.2008.01.023
dc.sourceScopus
dc.subjectBuckling
dc.subjectFinite deformation
dc.subjectFinite element analysis
dc.subjectPerturbation analysis
dc.subjectThin film
dc.typeArticle
dc.contributor.departmentCIVIL ENGINEERING
dc.description.doi10.1016/j.ijsolstr.2008.01.023
dc.description.sourcetitleInternational Journal of Solids and Structures
dc.description.volume45
dc.description.issue10
dc.description.page3107-3121
dc.identifier.isiut000255323900020
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