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https://scholarbank.nus.edu.sg/handle/10635/63337
Title: | SPC of a near zero-defect process subject to random shocks | Authors: | Xie, M. Goh, T.N. |
Issue Date: | Mar-1993 | Citation: | Xie, M.,Goh, T.N. (1993-03). SPC of a near zero-defect process subject to random shocks. Quality and Reliability Engineering International 9 (2) : 89-93. ScholarBank@NUS Repository. | Abstract: | In this paper we study the problem of monitoring and control of a type of process in which long series with no non-conformities are observed together with occasional samples containing a large number of non-conformities. We call this a near zero-defect process subject to random shocks. Such processes occur often in practice, and a model is proposed for the identification of real non-random variations of process characteristics. Based on the statistical analysis carried out for this model, a procedure for decision-making in the control of this type of process is suggested, and analysis of some actual cases presented. | Source Title: | Quality and Reliability Engineering International | URI: | http://scholarbank.nus.edu.sg/handle/10635/63337 | ISSN: | 07488017 |
Appears in Collections: | Staff Publications |
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