Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/63337
Title: SPC of a near zero-defect process subject to random shocks
Authors: Xie, M. 
Goh, T.N. 
Issue Date: Mar-1993
Source: Xie, M.,Goh, T.N. (1993-03). SPC of a near zero-defect process subject to random shocks. Quality and Reliability Engineering International 9 (2) : 89-93. ScholarBank@NUS Repository.
Abstract: In this paper we study the problem of monitoring and control of a type of process in which long series with no non-conformities are observed together with occasional samples containing a large number of non-conformities. We call this a near zero-defect process subject to random shocks. Such processes occur often in practice, and a model is proposed for the identification of real non-random variations of process characteristics. Based on the statistical analysis carried out for this model, a procedure for decision-making in the control of this type of process is suggested, and analysis of some actual cases presented.
Source Title: Quality and Reliability Engineering International
URI: http://scholarbank.nus.edu.sg/handle/10635/63337
ISSN: 07488017
Appears in Collections:Staff Publications

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