Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/63337
DC FieldValue
dc.titleSPC of a near zero-defect process subject to random shocks
dc.contributor.authorXie, M.
dc.contributor.authorGoh, T.N.
dc.date.accessioned2014-06-17T07:02:53Z
dc.date.available2014-06-17T07:02:53Z
dc.date.issued1993-03
dc.identifier.citationXie, M.,Goh, T.N. (1993-03). SPC of a near zero-defect process subject to random shocks. Quality and Reliability Engineering International 9 (2) : 89-93. ScholarBank@NUS Repository.
dc.identifier.issn07488017
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/63337
dc.description.abstractIn this paper we study the problem of monitoring and control of a type of process in which long series with no non-conformities are observed together with occasional samples containing a large number of non-conformities. We call this a near zero-defect process subject to random shocks. Such processes occur often in practice, and a model is proposed for the identification of real non-random variations of process characteristics. Based on the statistical analysis carried out for this model, a procedure for decision-making in the control of this type of process is suggested, and analysis of some actual cases presented.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.sourcetitleQuality and Reliability Engineering International
dc.description.volume9
dc.description.issue2
dc.description.page89-93
dc.description.codenQREIE
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.