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https://doi.org/10.1016/j.optcom.2004.03.039
Title: | Phase extraction from electronic speckle patterns by statistical analysis | Authors: | Tay, C.J. Quan, C. Chen, L. Fu, Y. |
Keywords: | Electronic speckle pattern Phase extraction Statistical analysis |
Issue Date: | 15-Jun-2004 | Citation: | Tay, C.J., Quan, C., Chen, L., Fu, Y. (2004-06-15). Phase extraction from electronic speckle patterns by statistical analysis. Optics Communications 236 (4-6) : 259-269. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optcom.2004.03.039 | Abstract: | In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random variable having a uniform distribution, the grey level variance of a number of pixels is found to be related to the modulation intensity of a speckle pattern. The relation is used to establish a connection between the phase to be measured and the variance of grey level difference between two speckle patterns. Subsequently, a phase map wrapped in [0,π) is extracted. In order to obtain a standard 2π wrapped phase map, an initial one step phase shift is introduced. The phase value of a pixel under consideration is obtained from the grey levels of its N × N neighbouring pixels. The optimal value of N is obtained based on a qualitative analysis of the initial results. With an appropriate value of N, an accuracy of 1% can be achieved. © 2004 Elsevier B.V. All rights reserved. | Source Title: | Optics Communications | URI: | http://scholarbank.nus.edu.sg/handle/10635/61090 | ISSN: | 00304018 | DOI: | 10.1016/j.optcom.2004.03.039 |
Appears in Collections: | Staff Publications |
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