Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.optcom.2004.03.039
Title: Phase extraction from electronic speckle patterns by statistical analysis
Authors: Tay, C.J. 
Quan, C. 
Chen, L.
Fu, Y. 
Keywords: Electronic speckle pattern
Phase extraction
Statistical analysis
Issue Date: 15-Jun-2004
Source: Tay, C.J., Quan, C., Chen, L., Fu, Y. (2004-06-15). Phase extraction from electronic speckle patterns by statistical analysis. Optics Communications 236 (4-6) : 259-269. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optcom.2004.03.039
Abstract: In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random variable having a uniform distribution, the grey level variance of a number of pixels is found to be related to the modulation intensity of a speckle pattern. The relation is used to establish a connection between the phase to be measured and the variance of grey level difference between two speckle patterns. Subsequently, a phase map wrapped in [0,π) is extracted. In order to obtain a standard 2π wrapped phase map, an initial one step phase shift is introduced. The phase value of a pixel under consideration is obtained from the grey levels of its N × N neighbouring pixels. The optimal value of N is obtained based on a qualitative analysis of the initial results. With an appropriate value of N, an accuracy of 1% can be achieved. © 2004 Elsevier B.V. All rights reserved.
Source Title: Optics Communications
URI: http://scholarbank.nus.edu.sg/handle/10635/61090
ISSN: 00304018
DOI: 10.1016/j.optcom.2004.03.039
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