Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.optcom.2004.03.039
DC FieldValue
dc.titlePhase extraction from electronic speckle patterns by statistical analysis
dc.contributor.authorTay, C.J.
dc.contributor.authorQuan, C.
dc.contributor.authorChen, L.
dc.contributor.authorFu, Y.
dc.date.accessioned2014-06-17T06:30:55Z
dc.date.available2014-06-17T06:30:55Z
dc.date.issued2004-06-15
dc.identifier.citationTay, C.J., Quan, C., Chen, L., Fu, Y. (2004-06-15). Phase extraction from electronic speckle patterns by statistical analysis. Optics Communications 236 (4-6) : 259-269. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optcom.2004.03.039
dc.identifier.issn00304018
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/61090
dc.description.abstractIn electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random variable having a uniform distribution, the grey level variance of a number of pixels is found to be related to the modulation intensity of a speckle pattern. The relation is used to establish a connection between the phase to be measured and the variance of grey level difference between two speckle patterns. Subsequently, a phase map wrapped in [0,π) is extracted. In order to obtain a standard 2π wrapped phase map, an initial one step phase shift is introduced. The phase value of a pixel under consideration is obtained from the grey levels of its N × N neighbouring pixels. The optimal value of N is obtained based on a qualitative analysis of the initial results. With an appropriate value of N, an accuracy of 1% can be achieved. © 2004 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.optcom.2004.03.039
dc.sourceScopus
dc.subjectElectronic speckle pattern
dc.subjectPhase extraction
dc.subjectStatistical analysis
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1016/j.optcom.2004.03.039
dc.description.sourcetitleOptics Communications
dc.description.volume236
dc.description.issue4-6
dc.description.page259-269
dc.description.codenOPCOB
dc.identifier.isiut000221921100004
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