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https://doi.org/10.1063/1.4769042
Title: | Universal scaling of resistivity in bilayer graphene | Authors: | Gopinadhan, K. Jun Shin, Y. Yang, H. |
Issue Date: | 26-Nov-2012 | Citation: | Gopinadhan, K., Jun Shin, Y., Yang, H. (2012-11-26). Universal scaling of resistivity in bilayer graphene. Applied Physics Letters 101 (22) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4769042 | Abstract: | We report the temperature dependent electrical transport properties of gated bilayer graphene devices. We see a clear evidence of insulating behavior due to electron-hole charge puddles. The electrical resistivity increases while the mobility decreases with decreasing temperature, a characteristic due to carrier inhomogeneity in graphene. The theoretical fittings using an empirical formula of single electron tunneling indicate that electrical resistivity follows a universal curve with a scaling parameter. The scaling parameter is determined to be a measure of the fluctuations in the electron-hole puddle distribution. © 2012 American Institute of Physics. | Source Title: | Applied Physics Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/57754 | ISSN: | 00036951 | DOI: | 10.1063/1.4769042 |
Appears in Collections: | Staff Publications |
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