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https://doi.org/10.1002/pssr.201206412
Title: | Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging | Authors: | Peloso, M.P. Palina, N. Banas, K. Banas, A. Hidayat, H. Hoex, B. Breese, M.B.H. Aberle, A.G. |
Keywords: | Defects Luminescence Multicrystalline silicon Silicon Solar cells X-ray fluorescence |
Issue Date: | Dec-2012 | Citation: | Peloso, M.P., Palina, N., Banas, K., Banas, A., Hidayat, H., Hoex, B., Breese, M.B.H., Aberle, A.G. (2012-12). Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging. Physica Status Solidi - Rapid Research Letters 6 (12) : 460-462. ScholarBank@NUS Repository. https://doi.org/10.1002/pssr.201206412 | Abstract: | Multicrystalline silicon wafer solar cells reveal performance- reducing defects by luminescence. X-ray fluorescence spectra are used to investigate the elemental constituents from regions of solar cells yielding reverse-bias or sub-bandgap luminescence from defects. It is found that a higher concentration of metals is present in regions yielding reverse-bias electroluminescence than in regions yielding sub-bandgap electroluminescence. This suggests, dislocations do not create strong breakdown currents in the absence of impurity precipitates. (a) Topographies of sub-bandgap (red) and reverse-bias (blue) luminescence from defects in a multicrystalline Si wafer solar cell. (b) Their distinct X-ray spectra indicate highest concentrations of metals in the blue regions. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. | Source Title: | Physica Status Solidi - Rapid Research Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/50959 | ISSN: | 18626254 | DOI: | 10.1002/pssr.201206412 |
Appears in Collections: | Staff Publications |
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