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|Title:||Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging||Authors:||Peloso, M.P.
|Issue Date:||Dec-2012||Citation:||Peloso, M.P., Palina, N., Banas, K., Banas, A., Hidayat, H., Hoex, B., Breese, M.B.H., Aberle, A.G. (2012-12). Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging. Physica Status Solidi - Rapid Research Letters 6 (12) : 460-462. ScholarBank@NUS Repository. https://doi.org/10.1002/pssr.201206412||Abstract:||Multicrystalline silicon wafer solar cells reveal performance- reducing defects by luminescence. X-ray fluorescence spectra are used to investigate the elemental constituents from regions of solar cells yielding reverse-bias or sub-bandgap luminescence from defects. It is found that a higher concentration of metals is present in regions yielding reverse-bias electroluminescence than in regions yielding sub-bandgap electroluminescence. This suggests, dislocations do not create strong breakdown currents in the absence of impurity precipitates. (a) Topographies of sub-bandgap (red) and reverse-bias (blue) luminescence from defects in a multicrystalline Si wafer solar cell. (b) Their distinct X-ray spectra indicate highest concentrations of metals in the blue regions. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.||Source Title:||Physica Status Solidi - Rapid Research Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/50959||ISSN:||18626254||DOI:||10.1002/pssr.201206412|
|Appears in Collections:||Staff Publications|
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