Please use this identifier to cite or link to this item: https://doi.org/10.1002/pssr.201206412
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dc.titleInvestigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging
dc.contributor.authorPeloso, M.P.
dc.contributor.authorPalina, N.
dc.contributor.authorBanas, K.
dc.contributor.authorBanas, A.
dc.contributor.authorHidayat, H.
dc.contributor.authorHoex, B.
dc.contributor.authorBreese, M.B.H.
dc.contributor.authorAberle, A.G.
dc.date.accessioned2014-04-24T07:22:24Z
dc.date.available2014-04-24T07:22:24Z
dc.date.issued2012-12
dc.identifier.citationPeloso, M.P., Palina, N., Banas, K., Banas, A., Hidayat, H., Hoex, B., Breese, M.B.H., Aberle, A.G. (2012-12). Investigation of defect luminescence from multicrystalline Si wafer solar cells using X-ray fluorescence and luminescence imaging. Physica Status Solidi - Rapid Research Letters 6 (12) : 460-462. ScholarBank@NUS Repository. https://doi.org/10.1002/pssr.201206412
dc.identifier.issn18626254
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/50959
dc.description.abstractMulticrystalline silicon wafer solar cells reveal performance- reducing defects by luminescence. X-ray fluorescence spectra are used to investigate the elemental constituents from regions of solar cells yielding reverse-bias or sub-bandgap luminescence from defects. It is found that a higher concentration of metals is present in regions yielding reverse-bias electroluminescence than in regions yielding sub-bandgap electroluminescence. This suggests, dislocations do not create strong breakdown currents in the absence of impurity precipitates. (a) Topographies of sub-bandgap (red) and reverse-bias (blue) luminescence from defects in a multicrystalline Si wafer solar cell. (b) Their distinct X-ray spectra indicate highest concentrations of metals in the blue regions. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/pssr.201206412
dc.sourceScopus
dc.subjectDefects
dc.subjectLuminescence
dc.subjectMulticrystalline silicon
dc.subjectSilicon
dc.subjectSolar cells
dc.subjectX-ray fluorescence
dc.typeArticle
dc.contributor.departmentSINGAPORE SYNCHROTRON LIGHT SOURCE
dc.contributor.departmentPHYSICS
dc.contributor.departmentSOLAR ENERGY RESEARCH INST OF S'PORE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1002/pssr.201206412
dc.description.sourcetitlePhysica Status Solidi - Rapid Research Letters
dc.description.volume6
dc.description.issue12
dc.description.page460-462
dc.identifier.isiut000312535700008
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