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https://doi.org/10.1002/adfm.202310838
Title: | Controlled Stepwise Wet Etching of Polycrystalline Mo Nanowires | Authors: | Khakimjon Saidov Ivan Erofeev Zainul Aabdin Antoine Pacco Harold Philipsen Antony Winata Hartanto Yifan Chen Hongwei Yan Weng Weei Tjiu Frank Holsteyns Utkur Mirziyodovich Mirsaidov |
Keywords: | metal nanowires wet etching digital etching cyclic etching liquid cell TEM |
Issue Date: | 12-Dec-2023 | Publisher: | Advanced Functional Materials | Citation: | Khakimjon Saidov, Ivan Erofeev, Zainul Aabdin, Antoine Pacco, Harold Philipsen, Antony Winata Hartanto, Yifan Chen, Hongwei Yan, Weng Weei Tjiu, Frank Holsteyns, Utkur Mirziyodovich Mirsaidov (2023-12-12). Controlled Stepwise Wet Etching of Polycrystalline Mo Nanowires 34 (12). ScholarBank@NUS Repository. https://doi.org/10.1002/adfm.202310838 | Rights: | Attribution-NonCommercial-NoDerivatives 4.0 International | Related Dataset(s): | 10.1002/adfm.202310838 | Abstract: | With the persistent downscaling of integrated circuits, molybdenum (Mo) is currently considered a potential replacement for copper (Cu) as a material for metal interconnects. However, fabricating metal nanostructures with critical dimensions of the order of 10 nm and below is challenging. This is because the very high density of grain boundaries (GBs) results in highly non-uniform surface profiles during direct wet etching. Moreover, wet etching of Mo with conventional aqueous solutions is problematic, as products of Mo oxidation have different solubility in water, which leads to increased surface roughness. Here, a process is shown for achieving a stable and uniform soluble surface layer of Mo oxide by wet oxidation with H2O2dissolved in IPA at−20°C. The oxide layer is then selectively dissolved, and by repeating the oxidation and dissolution multiple times, a uniform etch profile is demonstrated with a fine control over the metal recess. Ultimately, this presents a method of precise and uniform wet etching for Mo and other metals needed to fabricate complex nanostructures that are critical in developing next-generation electronic devices. | URI: | https://scholarbank.nus.edu.sg/handle/10635/248407 | ISSN: | 1616-301X 1616-3028 |
DOI: | 10.1002/adfm.202310838 | Rights: | Attribution-NonCommercial-NoDerivatives 4.0 International |
Appears in Collections: | Elements Staff Publications |
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SI_Saidov_etal.pdf | Supporting Information | 522.47 kB | Adobe PDF | OPEN | Pre-print | View/Download |
Manuscript_Saidov_etal.pdf | Manuscript document | 7.13 MB | Adobe PDF | OPEN | Pre-print | View/Download |
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