Please use this identifier to cite or link to this item: https://doi.org/10.1002/adfm.202310838
DC FieldValue
dc.titleControlled Stepwise Wet Etching of Polycrystalline Mo Nanowires
dc.contributor.authorKhakimjon Saidov
dc.contributor.authorIvan Erofeev
dc.contributor.authorZainul Aabdin
dc.contributor.authorAntoine Pacco
dc.contributor.authorHarold Philipsen
dc.contributor.authorAntony Winata Hartanto
dc.contributor.authorYifan Chen
dc.contributor.authorHongwei Yan
dc.contributor.authorWeng Weei Tjiu
dc.contributor.authorFrank Holsteyns
dc.contributor.authorUtkur Mirziyodovich Mirsaidov
dc.date.accessioned2024-05-13T02:34:00Z
dc.date.available2024-05-13T02:34:00Z
dc.date.issued2023-12-12
dc.identifier.citationKhakimjon Saidov, Ivan Erofeev, Zainul Aabdin, Antoine Pacco, Harold Philipsen, Antony Winata Hartanto, Yifan Chen, Hongwei Yan, Weng Weei Tjiu, Frank Holsteyns, Utkur Mirziyodovich Mirsaidov (2023-12-12). Controlled Stepwise Wet Etching of Polycrystalline Mo Nanowires 34 (12). ScholarBank@NUS Repository. https://doi.org/10.1002/adfm.202310838
dc.identifier.issn1616-301X
dc.identifier.issn1616-3028
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/248407
dc.description.abstractWith the persistent downscaling of integrated circuits, molybdenum (Mo) is currently considered a potential replacement for copper (Cu) as a material for metal interconnects. However, fabricating metal nanostructures with critical dimensions of the order of 10 nm and below is challenging. This is because the very high density of grain boundaries (GBs) results in highly non-uniform surface profiles during direct wet etching. Moreover, wet etching of Mo with conventional aqueous solutions is problematic, as products of Mo oxidation have different solubility in water, which leads to increased surface roughness. Here, a process is shown for achieving a stable and uniform soluble surface layer of Mo oxide by wet oxidation with H2O2dissolved in IPA at−20°C. The oxide layer is then selectively dissolved, and by repeating the oxidation and dissolution multiple times, a uniform etch profile is demonstrated with a fine control over the metal recess. Ultimately, this presents a method of precise and uniform wet etching for Mo and other metals needed to fabricate complex nanostructures that are critical in developing next-generation electronic devices.
dc.description.urihttps://doi.org/10.1002/adfm.202310838
dc.language.isoen
dc.publisherAdvanced Functional Materials
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectmetal nanowires
dc.subjectwet etching
dc.subjectdigital etching
dc.subjectcyclic etching
dc.subjectliquid cell TEM
dc.typeArticle
dc.contributor.departmentBIOLOGICAL SCIENCES
dc.contributor.departmentPHYSICS
dc.description.doi10.1002/adfm.202310838
dc.description.volume34
dc.description.issue12
dc.published.statePublished
dc.grant.idNRF-CRP23-2019-0001
dc.grant.fundingagencyNational Research Foundation Singapore
dc.relation.dataset10.1002/adfm.202310838
Appears in Collections:Elements
Staff Publications

Show simple item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
SI_Saidov_etal.pdfSupporting Information522.47 kBAdobe PDF

OPEN

Pre-printView/Download
Manuscript_Saidov_etal.pdfManuscript document7.13 MBAdobe PDF

OPEN

Pre-printView/Download

Google ScholarTM

Check

Altmetric


This item is licensed under a Creative Commons License Creative Commons