Please use this identifier to cite or link to this item: https://doi.org/10.1155/2020/8866406
Title: Low-Shot Wall Defect Detection for Autonomous Decoration Robots Using Deep Reinforcement Learning
Authors: Zeng, F.
Cai, X.
Ge, S.S. 
Issue Date: 2020
Publisher: Hindawi Limited
Citation: Zeng, F., Cai, X., Ge, S.S. (2020). Low-Shot Wall Defect Detection for Autonomous Decoration Robots Using Deep Reinforcement Learning. Journal of Robotics 2020 : 8866406. ScholarBank@NUS Repository. https://doi.org/10.1155/2020/8866406
Rights: Attribution 4.0 International
Abstract: Wall defect detection is an important function for autonomous decoration robots. Object detection methods based on deep neural networks require a large number of images with the handcrafted bounding box for training. Nonetheless, building large datasets manually is impractical, which is time-consuming and labor-intensive. In this work, we solve this issue to propose the low-shot wall defect detection algorithm using deep reinforcement learning (DRL) for autonomous decoration robots. Our algorithm first utilizes the attention proposal network (APN) to generate attention regions and applies AlexNet to extract the features of attention patches to further reduce computation. Finally, we train our method with deep reinforcement learning to learn the optimal detection policy. The experiments are implemented on a low-shot dataset in which images are collected from real decoration environments, and the experimental results show the proposed method can achieve fast convergence and learn the optimal detection policy for wall defect images. © 2020 Fanyu Zeng et al.
Source Title: Journal of Robotics
URI: https://scholarbank.nus.edu.sg/handle/10635/197342
ISSN: 16879600
DOI: 10.1155/2020/8866406
Rights: Attribution 4.0 International
Appears in Collections:Elements
Staff Publications

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
10_1155_2020_8866406.pdf2.44 MBAdobe PDF

OPEN

NoneView/Download

Google ScholarTM

Check

Altmetric


This item is licensed under a Creative Commons License Creative Commons