Please use this identifier to cite or link to this item: https://doi.org/10.1145/3460319.3464841
Title: Toward optimal mc/dc test case generation
Authors: Godboley, Sangharatna
Jaffar, Joxan 
Maghareh, Rasool
Dutta, Arpita
Issue Date: 11-Jul-2021
Publisher: ACM
Citation: Godboley, Sangharatna, Jaffar, Joxan, Maghareh, Rasool, Dutta, Arpita (2021-07-11). Toward optimal mc/dc test case generation. ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis. ScholarBank@NUS Repository. https://doi.org/10.1145/3460319.3464841
Source Title: ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis
URI: https://scholarbank.nus.edu.sg/handle/10635/194481
ISBN: 9781450384599
DOI: 10.1145/3460319.3464841
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