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https://doi.org/10.1109/JSSC.2021.3050959
Title: | PUF Architecture with Run-Time Adaptation for Resilient and Energy-Efficient Key Generation via Sensor Fusion | Authors: | SACHIN TANEJA ALIOTO,MASSIMO BRUNO |
Keywords: | Physically unclonable function resilient circuits run-time adaptation sensor fusion energy efficiency |
Issue Date: | 2-Mar-2021 | Publisher: | Institute of Electrical and Electronics Engineers Inc. | Citation: | SACHIN TANEJA, ALIOTO,MASSIMO BRUNO (2021-03-02). PUF Architecture with Run-Time Adaptation for Resilient and Energy-Efficient Key Generation via Sensor Fusion. IEEE Journal of Solid-State Circuits : 1 - 1. ScholarBank@NUS Repository. https://doi.org/10.1109/JSSC.2021.3050959 | Rights: | CC0 1.0 Universal | Abstract: | "This work introduces a novel class of fully-synthesizable all-digital True Random Number Generators (TRNGs) using the same private-key cryptographic core for raw dynamic entropy generation, its extraction via post-processing, and its utilization as crypto-key for constrained secure systems. Endogenous random bit generation is achieved via clock pulsewidth overstretching in the digital implementation of private-key cryptographic algorithms using pulsed-latch pipelines, leveraging inherent Shannon confusion and diffusion. Demonstration on a 40-nm testchip based on a SIMON cryptographic core shows 64-bit key encryption down to 0.25 pJ/bit at 0.45 V, random number generation with cryptographic-grade entropy at 2.5 pJ/bit across manufacturing lots, dice, voltages and temperature corners. The overall area is kept well below the 1E6 F2 area wall (F = minimum feature size). | Source Title: | IEEE Journal of Solid-State Circuits | URI: | https://scholarbank.nus.edu.sg/handle/10635/191221 | ISSN: | 00189200 1558173X |
DOI: | 10.1109/JSSC.2021.3050959 | Rights: | CC0 1.0 Universal |
Appears in Collections: | Staff Publications Elements |
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