Please use this identifier to cite or link to this item: https://doi.org/10.1109/JSSC.2021.3050959
Title: PUF Architecture with Run-Time Adaptation for Resilient and Energy-Efficient Key Generation via Sensor Fusion
Authors: SACHIN TANEJA 
ALIOTO,MASSIMO BRUNO 
Keywords: Physically unclonable function
resilient circuits
run-time adaptation
sensor fusion
energy efficiency
Issue Date: 2-Mar-2021
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: SACHIN TANEJA, ALIOTO,MASSIMO BRUNO (2021-03-02). PUF Architecture with Run-Time Adaptation for Resilient and Energy-Efficient Key Generation via Sensor Fusion. IEEE Journal of Solid-State Circuits : 1 - 1. ScholarBank@NUS Repository. https://doi.org/10.1109/JSSC.2021.3050959
Rights: CC0 1.0 Universal
Abstract: "This work introduces a novel class of fully-synthesizable all-digital True Random Number Generators (TRNGs) using the same private-key cryptographic core for raw dynamic entropy generation, its extraction via post-processing, and its utilization as crypto-key for constrained secure systems. Endogenous random bit generation is achieved via clock pulsewidth overstretching in the digital implementation of private-key cryptographic algorithms using pulsed-latch pipelines, leveraging inherent Shannon confusion and diffusion. Demonstration on a 40-nm testchip based on a SIMON cryptographic core shows 64-bit key encryption down to 0.25 pJ/bit at 0.45 V, random number generation with cryptographic-grade entropy at 2.5 pJ/bit across manufacturing lots, dice, voltages and temperature corners. The overall area is kept well below the 1E6 F2 area wall (F = minimum feature size).
Source Title: IEEE Journal of Solid-State Circuits
URI: https://scholarbank.nus.edu.sg/handle/10635/191221
ISSN: 00189200
1558173X
DOI: 10.1109/JSSC.2021.3050959
Rights: CC0 1.0 Universal
Appears in Collections:Staff Publications
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