Please use this identifier to cite or link to this item: https://doi.org/10.1038/srep17424
Title: Thickness-induced metal-insulator transition in Sb-doped SnO 2 Ultrathin Films: The role of quantum confinement
Authors: Ke, C
Zhu, W
Zhang, Z
Soon Tok, E 
Ling, B
Pan, J 
Issue Date: 2015
Publisher: Nature Publishing Group
Citation: Ke, C, Zhu, W, Zhang, Z, Soon Tok, E, Ling, B, Pan, J (2015). Thickness-induced metal-insulator transition in Sb-doped SnO 2 Ultrathin Films: The role of quantum confinement. Scientific Reports 5 : 17424. ScholarBank@NUS Repository. https://doi.org/10.1038/srep17424
Abstract: A thickness induced metal-insulator transition (MIT) was firstly observed in Sb-doped SnO 2 (SnO 2:Sb) epitaxial ultrathin films deposited on sapphire substrates by pulsed laser deposition. Both electrical and spectroscopic studies provide clear evidence of a critical thickness for the metallic conductivity in SnO 2:Sb thin films and the oxidation state transition of the impurity element Sb. With the shrinkage of film thickness, the broadening of the energy band gap as well as the enhancement of the impurity activation energy was studied and attributed to the quantum confinement effect. Based on the scenario of impurity level pinning and band gap broadening in quantum confined nanostructures, we proposed a generalized energy diagram to understand the thickness induced MIT in the SnO 2:Sb system.
Source Title: Scientific Reports
URI: https://scholarbank.nus.edu.sg/handle/10635/175461
ISSN: 20452322
DOI: 10.1038/srep17424
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