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https://doi.org/10.1063/1.4865804
Title: | Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements | Authors: | Hameiri, Z. Rougieux, F. Sinton, R. Trupke, T. |
Issue Date: | 2014 | Citation: | Hameiri, Z., Rougieux, F., Sinton, R., Trupke, T. (2014). Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements. Applied Physics Letters 104 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4865804 | Abstract: | A contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated. © 2014 AIP Publishing LLC. | Source Title: | Applied Physics Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/128895 | ISSN: | 00036951 | DOI: | 10.1063/1.4865804 |
Appears in Collections: | Staff Publications |
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