Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4865804
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dc.titleContactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements
dc.contributor.authorHameiri, Z.
dc.contributor.authorRougieux, F.
dc.contributor.authorSinton, R.
dc.contributor.authorTrupke, T.
dc.date.accessioned2016-10-22T07:45:34Z
dc.date.available2016-10-22T07:45:34Z
dc.date.issued2014
dc.identifier.citationHameiri, Z., Rougieux, F., Sinton, R., Trupke, T. (2014). Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements. Applied Physics Letters 104 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4865804
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/128895
dc.description.abstractA contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated. © 2014 AIP Publishing LLC.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4865804
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentSOLAR ENERGY RESEARCH INST OF S'PORE
dc.description.doi10.1063/1.4865804
dc.description.sourcetitleApplied Physics Letters
dc.description.volume104
dc.description.issue7
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000332038500077
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